Advanced transmission electron microscopy : (Record no. 36802)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 02311 a2200313 4500 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | NISER |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20260309161741.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 260309b |||||||| |||| 00| 0 hin d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781493982493 |
| Qualifying information | Paperback |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | NISER LIBRARY |
| Language of cataloging | eng |
| Transcribing agency | NISER LIBRARY |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 537.533.35 |
| Item number | ZUO-A |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Zuo, Jian Min |
| 245 10 - TITLE STATEMENT | |
| Title | Advanced transmission electron microscopy : |
| Remainder of title | imaging and diffraction in nanoscience |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | New York, NY : |
| Name of publisher, distributor, etc. | Springer, |
| Date of publication, distribution, etc. | 2017. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xxvi, 729 pages : |
| Other physical details | illustrations (92 b/w illustrations, 218 illustrations in colour) ; |
| Dimensions | 24 cm. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc | Includes bibliographical references and index. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc. | This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduatelevel text in support of course materials in Materials Science, Physics or Chemistry departments. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Transmission electron microscopy |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Electron diffraction geometry |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Electron diffraction theory |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Ultrafast electron diffraction |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Materials science |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Nanochemistry |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Photonics |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Spence, John C.H. |
| 856 41 - ELECTRONIC LOCATION AND ACCESS | |
| Materials specified | Table of contents |
| Uniform Resource Identifier | <a href="https://link.springer.com/content/pdf/bfm:978-1-4939-6607-3/1">https://link.springer.com/content/pdf/bfm:978-1-4939-6607-3/1</a> |
| 856 41 - ELECTRONIC LOCATION AND ACCESS | |
| Materials specified | Reviews |
| Uniform Resource Identifier | <a href="https://www.goodreads.com/book/show/42589417-advanced-transmission-electron-microscopy?ref=nav_sb_ss_1_13#CommunityReviews">https://www.goodreads.com/book/show/42589417-advanced-transmission-electron-microscopy?ref=nav_sb_ss_1_13#CommunityReviews</a> |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Book |
| Source of classification or shelving scheme | Universal Decimal Classification |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Date acquired | Source of acquisition | Cost, normal purchase price | Total Checkouts | Full call number | Barcode | Date last seen | Cost, replacement price | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Universal Decimal Classification | NISER LIBRARY | NISER LIBRARY | 09/03/2026 | 28 | 7286.49 | 537.533.35 ZUO-A | 26516 | 09/03/2026 | 9715.32 | 09/03/2026 | Book |
