MARC details
| 000 -LEADER |
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| fixed length control field |
02090nam a22002537a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20230822143759.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
221114b ||||| |||| 00| 0 hin d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9780521629959 |
| 040 ## - CATALOGING SOURCE |
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| Original cataloging agency |
NISER LIBRARY |
| Transcribing agency |
NISER LIBRARY |
| 041 ## - LANGUAGE CODE |
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| Language code of text/sound track or separate title |
English |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
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| Classification number |
519.716 |
| Item number |
GRA-I |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
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| Personal name |
Graef, Marc De |
| 245 ## - TITLE STATEMENT |
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| Title |
Introduction to conventional transmission electron microscopy |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
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| Place of publication, distribution, etc. |
Cambridge: |
| Name of publisher, distributor, etc. |
Cambridge University Press, |
| Date of publication, distribution, etc. |
2003. |
| 300 ## - PHYSICAL DESCRIPTION |
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| Extent |
xxi, 718p. |
| Other physical details |
Pbk. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
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| Bibliography, etc |
Table of Contents<br/><br/>1. Basic crystallography<br/>2. Basic quantum mechanics<br/>3. The transmission electron microscope<br/>4. Getting started<br/>5. Dynamical electron scattering in perfect crystals<br/>6. Two-beam theory in defect-free crystals<br/>7. Systematic row and zone axis orientations<br/>8. Defects in crystals<br/>9. Electron diffraction patterns<br/>10. Phase contrast microscopy<br/>Appendices. |
| 520 ## - SUMMARY, ETC. |
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| Summary, etc. |
This 2003 book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Transmission electron microscopy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Lattice geometry |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Crystal symmetry |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Bragg equation |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
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| Koha item type |
Book |
| Source of classification or shelving scheme |
Universal Decimal Classification |
