MARC details
| 000 -LEADER |
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| fixed length control field |
02049nam a22002537a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20230822145054.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
220407b ||||| |||| 00| 0 hin d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9780521142304 |
| 040 ## - CATALOGING SOURCE |
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| Original cataloging agency |
NISER LIBRARY |
| Transcribing agency |
NISER LIBRARY |
| 041 ## - LANGUAGE CODE |
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| Language code of text/sound track or separate title |
English |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
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| Classification number |
55 |
| Item number |
REE-E |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
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| Personal name |
Reed, S. J. B. |
| 245 ## - TITLE STATEMENT |
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| Title |
Electron microprobe analysis and scanning electron microscopy in geology |
| 250 ## - EDITION STATEMENT |
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| Edition statement |
2nd ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
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| Place of publication, distribution, etc. |
Cambridge: |
| Name of publisher, distributor, etc. |
Cambridge University Press, |
| Date of publication, distribution, etc. |
2005 |
| 300 ## - PHYSICAL DESCRIPTION |
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| Extent |
xiii,189 p. |
| Other physical details |
Pbk. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
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| Bibliography, etc |
Table of Contents<br/><br/>Preface<br/>Acknowledgements<br/>1. Introduction<br/>2. Electron-specimen interactions<br/>3. Instrumentation<br/>4. Scanning electron microscopy<br/>5. X-ray spectrometers<br/>6. Element mapping<br/>7. X-ray analysis (1)<br/>8. X-ray analysis (2)<br/>9. Sample preparation<br/>Appendix<br/>References<br/>Index. |
| 520 ## - SUMMARY, ETC. |
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| Summary, etc. |
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Petrofabric analysis |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Electron probe microanalysis |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Scanning electron microscopy |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
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| Koha item type |
Book |
| Source of classification or shelving scheme |
Universal Decimal Classification |
