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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces - New York, NY Springer New York 2011.

Chemistry and Materials Science (Springer-11644)

ISBN: 9781441978172, 978-1-4419-7817-2

Subjects--Topical Terms:
Ceramics, Glass, Composites, Natural Methods
Chemistry, Physical organic
Atomic/Molecular Structure and Spectra
Materials
Materials Science
Microengineering
Microreactors
Physical Chemistry
Spectroscopy and Microscopy
Structural Materials

Dewey Class. No.: 620.14, / 23

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